Project Details
Projekt
Microstructure-based classification and electronmicroscopy analysis of nanoporous metals by machine learning (B09)
Subject Area
Synthesis and Properties of Functional Materials
Term
from 2018 to 2024
Project identifier
Deutsche Forschungsgemeinschaft (DFG) - Project number 192346071
Focused ion beam (FIB) tomography determines the three-dimensional microstructure of materials via a series of two-dimensional scanning electron microscope (SEM) images. In nanoporous metals, FIB tomography is often facing problems with so-called shine-through effects, which can significantly reduce the accuracy with which FIB tomography data can be segmented. This project will use machine learning to develop a new segmentation method which can efficiently suppress shine-through effects and thus enable a reconstruction even of complex hierarchical multi-scale microstructures of nanoporous metals with excellent accuracy.
DFG Programme
Collaborative Research Centres
Subproject of
SFB 986:
Tailor-Made Multi-Scale Materials Systems - M3
Applicant Institution
Technische Universität Hamburg
