Surface Analysis Platform: X-Ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) (Z01)

• Subject Area: Chemistry
• Term: from 2016 to 2020
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 259079535

The Surface Analysis Platform combines complementary XPS and ToF-SIMS with Ar cluster ion sputter depth profiling to quantitatively evidence every single reaction step of the macromolecular synthesis routes on various substrates and to evidence 3D structures at high spatial resolution. For all subprojects of section B and C, individual approaches will be adapted to prevent method induced damage. If necessary, NEXAFS and FE-SEM are available to corroborate the results. Thus, the platform will provide quantitative chemical and molecular information on the chemical and geometrical integrity of the prepared structures and modifications.

• DFG Programme: Collaborative Research Centres
• Subproject of: SFB 1176: Molekulare Strukturierung weicher Materie
• Applicant Institution: Karlsruher Institut für Technologie
• Project Heads: Dr. Michael Bruns; Professor Dr. Helmut Ehrenberg; Professor Dr. Christof Wöll