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Bendable wireless sensors and millimetre-wave transmitters using thinned SiGe BiCMOS Acronym: Bend-IT

Subject Area Electronic Semiconductors, Components and Circuits, Integrated Systems, Sensor Technology, Theoretical Electrical Engineering
Term from 2017 to 2021
Project identifier Deutsche Forschungsgemeinschaft (DFG) - Project number 356463945
 
Final Report Year 2021

Final Report Abstract

In this research project, bendable wireless transmitters, fabrication techniques and circuits have been investigated. The focus of the project was to study the behavior of mm-wave circuits which are fabricated in a standard state-of-the-art technology after aggressive thinning to enable the bending of these chips. A transmitter system, consisting of a 190 GHz voltage-controlled oscillator, two buffering power amplifiers as well as a folded dipole antenna array was devised. The power amplifier as well as the antenna were especially designed for this system. All circuit blocks are interconnected by passive electromagnetic baluns. This architecture includes all high frequency building blocks on chip resulting in a fully self-contained system which only requires DC power supplied. The manufacturing of the circuit is based on the state-of-the-art IHP SG13 BiCMOS process. An advanced finite element model is designed in ANSYS 18.2 and validated by both analytical equations and measurements to characterize the in-plane stress induced wafer deformation. The model includes most of the fabrication details and is highly simplified as well using the first order shear deformation theory. It features a high accuracy in comparison with the measurement results. The material residual stresses resulted from each back-end process step is extracted based on the derived model. Besides, the wafer deformation variation corresponded to different wafer thicknesses, as well as the gravity induced deformation are both characterized using this model. Extensive effort was put in the characterization of the system. The transistor DC behaviors are compared and analyzed before and after the wafer thinning to provide information for the circuit characterization. As for the circuit characterization, the standard thickness chips were measured and analyzed firstly to provide a reference point of the performance. Next, the chips, thinned down to 20 μm total thickness, were characterized. This included the measurement of the ultra-thin chips (UTC) without the antenna on the wafer prober and was completed by attaching and bonding the devices to a semi-rigid bendable PCB as a chip carrier enabling, combined with custom 3D printed fixtures, the characterization in a bend state. Finally, the antenna pattern was studied by means of a specifically build measurement setup and compared against theoretical electromagnetic simulation. The measurements results prove that the circuit operate at millimeter-wave frequencies with reasonable performance after thinning. The overall output power was decreased by a maximum of 8 dB while the oscillation frequency of the VCO under bending stress shifted by only 1 % around 186.5 GHz. Further improvements in the fabrication of thinned chips will even better align the performance of standard thickness and thinned chips by further limiting the damages to the chips in production.

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