Orbital Mapping Near Interfaces
Final Report Abstract
The experiments together with the simulation showed that energy filtered image at energy other than the zero loss signal always contains inelastic and elastic information. Even for the thinnest possible material a complete pure inelastic image containing elemental information only can not be archived. The unavoidable elastic part results in phase information similar to classic HRTEM images (dark and white atom contrast, depending on the focus). Therefore image simulation is mandatory. The orbitals require very narrow energy windows that reduces the the total intensity. For the case of graphe, the intensity drops by factor 8000 for a 10 eV window compared to the zero loss image. Longer exposure times are usually prevented by sample drift or for the case of TiO2 by beam damage even at 80 kV. As consequence orbital mapping using just energy filtered TEM is extremely difficult and in practise not feasible.
Publications
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Lattice contrast in the core-loss EFTEM signal of graphene. Ultramicroscopy, 219, 113119.
Mohn, Michael J.; Biskupek, Johannes; Lee, Zhongbo; Rose, Harald & Kaiser, Ute
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“Energy-filtered TEM and low-loss EELS of 2D materials”, Dissertation, Universität Ulm (2020)
M. J. Mohn
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Obstacles for atomic-resolution elemental mapping by EFTEM”, Microscopy Conference 2021, Conference Proceedings (2021)
M. J. Mohn, J. Biskupek, Z. Lee, H. Rose & U. Kaiser
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“Beyond conventional chemical mapping: prospects and challenges of orbital mapping” Microscopy Conference 2023
S. Löffler, M.l Ederer, M. Oberaigner, M. Mohn, J Biskupek, U Kaiser, G. Kothleitner, Q Ramasse, D Kepaptsoglou & M Bugnet
