Prior knowledge-based analysis of atomic-resolution image data (A04)

• Subject Area: Computer-Aided Design of Materials and Simulation of Materials Behaviour from Atomic to Microscopic Scale
• Term: since 2020
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 409476157

The aim of the project is to develop and implement new methods for automatic crystal defect analysis of atomic-resolution image data. For this purpose, we will develop methods for automatic detection of structures/patterns in 2D atomic lattices. In addition, we will design methods for automatic bump fitting, i.e. localisation of atoms in image data. Together, we will use these as a basis for quantitative comparison of corresponding structures in experimental and simulated data. The developed image analysis algorithms will be dockerised and thus made accessible to the entire CRC.

• DFG Programme: Collaborative Research Centres
• Subproject of: SFB 1394: Structural and Chemical Atomic Complexity: From Defect Phase Diagrams to Material Properties
• Applicant Institution: Rheinisch-Westfälische Technische Hochschule Aachen
• Project Head: Professor Dr. Benjamin Berkels