In situ Atomic Force Microscope (in situ AFM)

• Subject Area: Materials Engineering
• Term: Funded in 2020
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 445052562

The in situ Atomic Force Microscope (in situ AFM) will be used in combination with the available Focused Ion Beam Scanning Electron Microscope (FIB-SEM, Zeiss Crossbeam 550L) in ongoing and planned research projects as well as in interdisciplinary and international research cooperations, with the aim to describe the mechanisms of microstructure-based physical-mechanical material behavior. It is of particular importance to undertake meticulous studies on the relationship between microstructure properties, and deformation and damage behavior. The aim is to obtain the most comprehensive information from all microstructural levels and to link it with data from mechanical and technological investigations, and describe it qualitatively and quantitatively. The in operando acquired data from mechanical tests, which are based on physical material reactions during loading and measured using thermal, electrical, micromagnetic, optical and acoustic sensors are particularly valuable. In order to relate these physical characteristics to the microstructure, investigations using light and scanning electron microscopy must be enhanced by scanning atomic force microscopy. With the help of in situ AFM characterization, all the local topographic, microstructural, micromechanical, electrical, micromagnetic and corrosive properties under mechanical-thermal-corrosive loading can be precisely measured and linked with the in operando determined material and component properties for understanding of a process-structure-propertyrelashionship. A combination with available SEM methods such as EDX and EBSD analyses as well as 3D characterization by means of FIB-SEM, allow a simultaneous and holistic property description of microstructural elements, that will also be used for modeling and simulation. As a result of this significant gain in knowledge, the microstructure-based mechanisms of material behavior will be investigated scientifically in situ and linked to the macroscopic properties by creating accurate models of deformation, damage and service life.

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: In-situ-Rasterkraftmikroskop (in-situ-AFM)
• Instrumentation Group: 5091 Rasterkraft-Mikroskope
• Applicant Institution: Technische Universität Dortmund
• Leader: Professor Dr.-Ing. Frank Walther