Project Details
Projekt
Field emission scanning electron microscope (FESEM) with energy dispersive X-ray spectroscopy (EDX)
Subject Area
Materials Science
Term
Funded in 2025
Project identifier
Deutsche Forschungsgemeinschaft (DFG) - Project number 565001335
The Albstadt-Sigmaringen University of Applied Sciences is applying for the purchase of a high-resolution field emission scanning electron microscope including energy-dispersive X-ray spectroscopy and accessories to strengthen applied research in the three priority areas of sustainable development - smart materials and products, health - nutrition - biomedicine, and digitization - IT security - industry 4.0. The FE-SEM is a central tool for meeting the highly complex requirements of these research fields and promoting scientific excellence. The SEM is needed to work on the following key projects in the fields of materials and process technology, life sciences, packaging and computer science: development of nanocomposites and functional materials; characterization of components produced using additive manufacturing with regard to microstructure, topography and element distribution; investigation of the ultrastructure of human-pathogenic, food-associated bacteria; research into the effects of antimicrobial electron beam and plasma treatments on spores; visualization of neurite damage during cell death; analysis of polymer layers, interfaces and defects in packaging; and conducting forensic investigations on hardware components. For these projects, it is essential to be able to visualize structures down to the nano-meter range. The field emission scanning electron microscope that has been applied for meets these requirements by: (1) the highest resolution at low excitation voltages, which means that sensitive samples can be analyzed, (2) elemental analysis using energy-dispersive X-ray spectroscopy, which is indispensable for chemical characterization, (3) flexibility for conductive and non-conductive samples, which broadens the range of applications. The required performance class is a result of the need to analyze complex samples without artefacts. An already conducted vibration analysis at the intended location confirms that active vibration damping is necessary to ensure the high spatial resolution. In addition, special accessories are required for sample preparation in order to cover the wide range of applications: a hot mounting press for gap-free embedding; a grinding and polishing machine to produce smooth surfaces; an ion polishing device for artefact-free analyses of microelectronic components; a sputter coater and carbon evaporator to avoid charging effects in the case of non-conductive samples; a cryo-microtome for the preparation of soft biological materials; a drying cabinet and (super)critical point drying for the preparation of sensitive samples for the vacuum environment of the scanning electron microscope. The purchase of this SEM is indispensable for intensifying interdisciplinary research, achieving publication-relevant results and positioning the university as an excellent research location.
DFG Programme
Major Research Instrumentation
Major Instrumentation
Feldemissions-Rasterelektronenmikroskop für die Durchführung von EDS-, WDS- und EBSD-Messungen
Instrumentation Group
5120 Rasterelektronenmikroskope (REM)
Applicant Institution
Hochschule Albstadt-Sigmaringen
