Test system for power semiconductors and power electronic systems

• Subject Area: Electrical Engineering and Information Technology
• Term: Funded in 2025
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 571344710

Power electronic circuits are used to convert electrical energy and are becoming increasingly important and widely used in industrial plants and everyday life (e.g., electromobility, mobile phone chargers, etc.). To achieve efficiency, design, and sustainability goals, it is essential to be able to analyze and evaluate the operating parameters of power electronic circuits and the power semiconductors involved in energy conversion. In addition to classic static and dynamic design parameters, models can also be derived from this, which can be used, e.g., to predict the service life of these circuits or components.In a double pulse test, the component or device under test is subjected to two successive switching pulses. Numerous design-relevant parameters, such as switching gradients, power losses, charge quantities, etc., can be derived from the switching processes, which are often not available in sufficient detail in data sheets. Due to the selectable boundary conditions of these tests, such as different gate configurations or different temperatures, the operating behavior can be determined very close to real operating conditions.The test system described here can perform these tests and is also designed to meet the requirements of modern, fast-switching components. These components in particular pose significant challenges for the measurement technology, performance, and ideal nature of the surrounding circuit technology for control and analysis. The test system basically consists of several core components that are specially coordinated to enable the investigations only in combination, e.g., optimized shunts and an oscilloscope with high bandwidth and high vertical resolution.To address different issues, the system is modularly organized into three safety workstations. In addition to classic characterization and testing of new measurement technology, this system will also enable investigations under extreme operating conditions, such as the use of components in low-temperature ranges or the analysis of accelerated life cycle tests through active power cycling.

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: Prüfsystem für Leistungshalbleiter und leistungselektronische Systeme
• Instrumentation Group: 2780 Spezielle Meß- und Prüfgeräte für Halbleiter und Röhren (außer 620-659)
• Applicant Institution: Hochschule Kaiserslautern
• Leader: Professor Dr.-Ing. Christian Schumann