Cryo-Scanning Electron Microscope

• Subject Area: Physical Chemistry
• Term: since 2026
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 572508951

The aim of this application is to procure a scanning electron microscope with a freeze fracture preparation unit (cryo-scanning electron microscope), in which samples of different material classes can be analysed. It should be possible to image materials either directly or after freeze fracture with very high resolution. The device should have detectors for backscattered and secondary electrons and also allow scanning transmission electron microscopy measurements. High-resolution measurements at small working distances should be possible. The device will be used to investigate various material systems that are currently being researched in the research groups of the participating applicants. In the field of soft matter, lamellar phases and microemulsions are interesting systems that have unique properties. Cryo-electron microscopy is a very proven method for imaging these usually liquid systems. The freeze-fracture technique will also be used to analyse so-called Pickering emulsions. Moreover, the device will be used to analyse perovskites. Long-term stable, lead-free alternatives are currently being researched for the use of perovskites in solar cells. The device applied for here is to be used for the investigation of functional coatings, in particular utilising high-resolution imaging. Furthermore, the device is to be used for the further development of highly sensitive and ultra-high-resolution methods of optical microscopy with a view to applications in biomedicine. To this end, data obtained using high-resolution optical microscopy methods on cells will be compared with images obtained via freeze fracture. In addition, the device will also be available for further measurements as part of the Ostwestfalen-Lippe analytics centre and for service measurements.

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: Kryo-Rasterelektronenmikroskop
• Instrumentation Group: 5120 Rasterelektronenmikroskope (REM)
• Applicant Institution: Universität Bielefeld
• Leader: Professor Dr. Thomas Hellweg