Equipment upgrade for the X-ray diffractometer (XRD system)

• Subject Area: Materials Science
• Term: since 2026
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 580407521

Knowledge of microstructural properties is crucial for understanding the relationship between process, structure, and properties in order to optimize manufacturing processes and performance. Important microstructural properties, such as residual stresses, phase compositions, and dislocation densities, are currently being determined by the applicant in over 20 ongoing and planned projects using the XRD Bruker D8 Discover X-ray diffractometer. The system is nearly ten years old and shows signs of wear and tear due to intensive use, which manifests itself in the form of reduced reliability and longer downtimes. In addition, the 1D detector is no longer state of the art. The resolution and measurement time are limited compared to 2D detectors. As a result, relevant properties of the microstructure can only be analyzed selectively. Detailed examination in the form of mappings, e.g., to determine the residual stress distribution after the brazing process, is not possible. Intermittent measurements during mechanical testing, e.g., to reconstruct the development of the dislocation density, are also not possible. In addition, the increased requirements for newly developed analysis and evaluation methods are not sufficiently fulfilled. The upgrade will include general servicing, an expansion of the functional capabilities, the replacement of a chrome X-ray tube, and the installation of a new 2D detector. The expanded functional capacities allow modern mathematical models to be used for the evaluation and analysis of measurement results, or custom models to be implemented. This enables the measurement data to be specifically adjusted and initial evaluation inaccuracies, such as those caused by two overlapping peaks, to be manually corrected retrospectively, thereby greatly improving the quality of the measurement data post-processing. A modern, powerful 2D-detector that uses hybrid photon counting (HPC) technology will also significantly improve the field of materials science and engineering. Through pixel-by-pixel analysis of the radiation over a defined area, Debye-Scherrer rings can also be recorded and evaluated. This enables in-depth, detailed microstructure analyses of metals, ceramics, polymers, and biomaterials - from the nano to the micro to the macro scale. Overall, the upgrading of the XRD will significantly expand the applicant's expertise in the field of microstructure analysis. By involving other working groups with different research focuses, the expanded functionality of the upgraded Bruker D8 Discover X-ray diffractometer can be made available to a larger user group, thereby significantly increasing scientific knowledge.

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: Röntgendiffraktometer (XRD-System) (Erneuerung)
• Instrumentation Group: 4010 Einkristall-Diffraktometer
• Applicant Institution: Technische Universität Dortmund
• Leader: Professor Dr.-Ing. Frank Walther