Project Details
Projekt
Renewal of a scanning electron microscope
Subject Area
Materials Engineering
Term
since 2026
Project identifier
Deutsche Forschungsgemeinschaft (DFG) - Project number 582149487
The application is for the renewal of a field emission scanning electron microscope. This device is for use in a wide range of scientific research. The basic system of the device (chamber, electron column, vacuum system, etc.) will remain unchanged. After more than 20 years of intensive use, the device will be upgraded and sustainably reused for at least another 10 years. The scanning electron microscope is located in a core facility that focuses on microscopy and materials analysis, with a modern laboratory environment and the appropriate staff. This structure enables researchers to use various methods or devices efficiently for their research questions. Various research disciplines are addressed, such as mechanical engineering, process engineering, medical technology, electrical engineering, medicine, biology and others. Within the context of a user concept and regulations recognized by the DFG by acceptance in the RI-Sources portal, the device can be used in service or user mode. For independent use, each user is provided with the necessary theoretical and practical knowledge for operation in a professional training session. The specific research question is addressed individually and further work is continuously supported. The main items of the modernization are the dismantling of the low-vacuum function, the dismantling of the currently existing analytical detectors, the dismantling of the currently existing backscattered electron detector, the update of the software for controlling the electron microscope, including the necessary hardware adjustments (beam control/scan generator, etc.), the renewal of the technology of the microscope PC, the renewal of the analytical components and the necessary computer equipment (analytical PC, software), the renewal of the backscattered electron detector and the installation of a modern operating system (control panel, trackball, etc.). The modernization will take into account the requirements of the broad range of user groups. In future, the device will enable users to work with state-of-the-art device performance and intuitive control. In addition to topography imaging using a secondary electron detector, backscattered electron imaging with a modern multi-quadrant semiconductor detector is also possible. An EDS detector with a light element configuration enables precise element analysis. Here, the elemental composition of samples can be determined qualitatively and quantitatively and also be visualized in the form of mappings and line scans. Phase determination and orientation analyses are performed using backscattered electron diffraction (EBSD). State-of-the-art camera and evaluation technology is available for this purpose. This enables fast measurements with high pattern rates.
DFG Programme
Major Research Instrumentation
Major Instrumentation
Erneuerung eines Rasterelektronenmikroskops
Instrumentation Group
5120 Rasterelektronenmikroskope (REM)
Applicant Institution
Otto-von-Guericke-Universität Magdeburg
