Dual-source X -ray Diffractometer for Single Crystals

• Subject Area: Molecular Chemistry
• Term: since 2026
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 586098854

Structural analysis of single crystals can elucidate the three-dimensional structure of molecules in a single crystal and is therefore indispensable for most researchers working in molecular chemistry. In recent years, the two main components of diffractometers, detectors and X-ray sources, have undergone enormous advances, enabling significantly smaller and weaker scattering crystals to be measured than before. For larger/better crystals, this also means that results can be obtained within hours instead of days, leading to significantly better performance. The University of Bielefeld has numerous internationally competitive research groups that rely on good technical equipment. With five X-ray diffractometers for single crystals, the University of Bielefeld was also very well equipped until recently, but the devices are all more than twelve years old; two of them have now completely failed. In addition, repair costs are steadily increasing and further total failures are imminent at any time. A package of applications has been submitted for two new state-of-the-art four-circle diffractometers with microfocus X-ray tubes and hybrid pixel detectors, which must cover both the needs of routine operation and time-consuming specialized measurements. The two devices form the basis of Bielefeld University's new X-ray diffractometer infrastructure platform, which will handle all single-crystal structure analyses at Bielefeld University. Cooperative use generates a wide range of synergies, e.g., in the area of sample throughput (optimal use of measurement capacities by coordinating all measurements), sustainability (operation of two devices with microfocus sources instead of five devices, some of which still operate with classic X-ray tubes), maintenance (devices from only one manufacturer), personnel (redundant support and knowledge of the devices), and measurement quality (selection of the appropriate device for the respective sample).

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: Dual-source-Röntgendiffraktometer für Einkristalle
• Instrumentation Group: 4010 Einkristall-Diffraktometer
• Applicant Institution: Universität Bielefeld
• Leader: Professor Dr. Norbert W. Mitzel