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Projekt Druckansicht

Rasterelektronenmikroskop mit fokussiertem Ionenstrahl (FIB-REM)

Fachliche Zuordnung Materialwissenschaft
Förderung Förderung in 2011
Projektkennung Deutsche Forschungsgemeinschaft (DFG) - Projektnummer 181497383
 
Erstellungsjahr 2015

Zusammenfassung der Projektergebnisse

In the last 3 years the FIB-SEM is being used at IfW, TU Braunschweig extensively for research and development of high temperature and nano-materials, and is an exclusive tool for various analyses. The microscope has been specifically used in the following work: Co-Re high temperature alloy development; 3D characterization of nanoporous single crystal superalloys; Nanoforming of metallic objects; Micromanipulation to identify chemical compositions of individual particles; TBC Characterization; EBSD studies on Titanium alloys. Two examples are given in the following. The first example relates to nanoporous superalloy membranes being developed at IfW. To understand mechanical properties and permeability of these materials, the 3D arrangement of ligaments and porosity has to be analyzed. This was done for the first time using the slice and view technique offered by the dual beam microscope. A further research project at the IfW is the forging of metallic structures in the submicron and nanoscale. In this context, the dual beam microscope is used to shape forging tools out of silicon wafers by FIB milling. Furthermore, micromanipulators are integrated in the microscope to operate the forging tools and handle the work pieces. This research would not have been possible without this dual beam microscope. The high resolution of the microscope even at fast image acquisition rates along with video capabilities further facilitated this research.

Projektbezogene Publikationen (Auswahl)

 
 

Zusatzinformationen

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