Messung der Antwortzeit und Stärke des optischen Kerr-Effektes in Materialien variabler Bandlücke
Zusammenfassung der Projektergebnisse
The major work items of the subproject were dedicated to the preparation and characterization of coatings with extremely large thickness beyond values of 100 µm. In order to achieve this target on the technical level, the deposition system had been extended by an improved substrate rotation concept in combination with a substrate heating unit, and the corresponding characterization techniques for layer thickness, optical losses as well as the non-linear refractive index were adapted. In different coating materials of the ternary oxide compounds AlxSiyOz NbxAlyOz, and HfxAlyOz, layers with thicknesses up to 182 µm with reduced internal stress and low optical losses could be produced. The nonlinear properties of these novel materials have been investigated on the basis of an interferometric measurement of the wave front curvature from the intensity-induced Kerr lens as well as by generating the third harmonic (THG). By analyzing the THG in thin wedged layer structures, a novel method for measuring the nonlinear susceptibility was proposed and demonstrated.
Projektbezogene Publikationen (Auswahl)
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Measurement of nonlinear refractive index in optical thin films. Conference SPIE laser damage 2017
M. Steinecke, K. Kiedrowski, M. Jupé, D. Ristau
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Measurement of the nonlinear refractive index in optical thin films. Proceedings, Conference SPIE laser damage 2017
M. Steinecke, M. Jupé, K. Kiedrowski, D. Ristau
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Measurement setup for the determination of the nonlinear refractive index of thin films with high nonlinearity. Eur. Phys. J. Appl. Phys, Vol. 80 Nr. (3) (2017)
M. Steinecke, K. Kiedrowski, M. Jupé, D. Ristau
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Very thick mixture oxide thin IBS films for investigation of nonlinear material properties. Conference CIP-Miatec 2017
M. Steinecke, K. Kiedrowski, M. Jupé, D. Ristau
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Measurement setup for the determination of the nonlinear refractive index of thin films with high nonlinearity. Conference SPIE laser damage 2018
M. Steinecke, T. Kellermann, M. Jupé, D. Ristau, L. Jensen
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Measurement setup for the determination of the nonlinear refractive index of thin films with high nonlinearity. Proceedings, Conference SPIE laser damage 2018
Morten Steinecke, Tarik Kellermann, Marco Jupé, Detlev Ristau, Lars Jensen
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Third harmonic generation from thin gradient layers. 9th EPS-QEOD EUROPHOTON conference (2020), poster Tu-P1.7
David Zuber, Ayhan Tajalli, Morten Steinecke, Marco Jupé, Lars Jensen, Detlev Ristau, and Uwe Morgner
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Study of Third Harmonic Generation From Thin Gradient HfxAlyOz Layerss. Conference on Lasers and Electro-Optics (CLEO Europe 2021), online contribution
David Zuber, Sven Kleinert, Ayhan Tajalli, Morten Steinecke, Marco Jupé, Lars Jensen, Detlev Ristau, and Uwe Morgner
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Third harmonic generation from thin gradient ternary mixture layers, Conference on Lasers and Electro-Optics (CLEO 2021), paper JTh3A.70
D. Zuber, S. Kleinert, A. Tajalli, M. Steinecke, M. Jupé, L. Jensen, D. Ristau, and U. Morgner
