Berlin Electron Microscopy Network (BerlinEM Network) - Advanced Electron Holography of Nanostructured Semiconductors

• Applicants: Professor Dr. Christoph Tobias Koch; Professor Dr. Michael Lehmann
• Subject Area: Mechanical Properties of Metallic Materials and their Microstructural Origins ; Electronic Semiconductors, Components and Circuits, Integrated Systems, Sensor Technology, Theoretical Electrical Engineering
• Term: from 2017 to 2021
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 324666853

A network for electron microscopy of nanostructured semiconductors shall be established in which different universities and research institutes in the greater Berlin area will actively interact. This network shall include both electron microscopy laboratories as well as producers of semiconductor nanostructures. The starting point for this network shall be a core facility for electron holography in which state-of-the-art electron holographic characterization of strain, charge concentration, electric fields and similar properties will be offered. Different kick-off projects with various network partners are defined which will serve as seed for long-lasting cooperation within the network. Ultimately, the range of electron microscopy characterization techniques covered by the network will be expanded beyond electron holography. The application of cutting-edge characterization techniques to highly relevant problems will help the network and core facility for electron holography to establish national and international visibility.

• DFG Programme: Core Facilities
• Participating Persons: Professorin Dr.-Ing. Silke Christiansen; Dr. Gerrit Fiol; Christoph Hums; Dr. Katja Höflich; Professor Dr. Bernd Rech; Professor Dr. Thomas Schröder; Dr. Markus Wollgarten