Focused ion beam scanning electron microscope (FIB-SEM)

• Fachliche Zuordnung: Medizin ; Neurowissenschaften
• Förderung: Förderung in 2018
• Projektkennung: Deutsche Forschungsgemeinschaft (DFG) - Projektnummer 388171357

The instrument is going to be used for small-scale and/or semi-high-throughput image screening applications in multi-well plate format. The fluorescence mode will allow for multiple detection channels with fast acquisition and/or high resolution; and the integrated software analysis module will allow for large-scale image analysis and robust data management. The instrument will be placed in an imaging core facility, together with other core facilities, to serve as a central place for instrument-based services.

• DFG-Verfahren: Forschungsgroßgeräte
• Großgeräte: Focused ion beam scanning electron microscope (FIB-SEM)
• Gerätegruppe: 5120 Rasterelektronenmikroskope (REM)
• Antragstellende Institution: Universitätsklinikum Bonn
• Leiter: Professor Dr. Heinz Beck; Professor Dr. Eicke Latz