Korrelationsbasierte Systemanalyse und Hintergrund-Korrektur für Sigma-Delta Analog-Digital Umsetzer durch Nutzung optimaler Testsignale

• Applicant: Professor Dr.-Ing. Maurits Ortmanns
• Subject Area: Electronic Semiconductors, Components and Circuits, Integrated Systems, Sensor Technology, Theoretical Electrical Engineering
• Term: from 2007 to 2011
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 40403750

• Final Report Year: 2011

Final Report Abstract

No abstract available

Publications

• “A background DAC error estimation in Sigma-Delta ADCs using a pseudo random noise based correlation technique,” in IEEE Int. Symp. on Circuits Syst. (ISCAS), 2009, pp. 1549–1552
  P. Witte and M. Ortmanns
  
• “A pseudo random noise based correlation technique for background DAC error estimation in Σ∆ ADCs,” in 11. Workshop Analogschaltungen, Hannover, Deutschland 2009
  P. Witte, and M. Ortmanns
  
• Hardware complexity of a correlation based background DAC error estimation technique for Sigma-Delta ADCs,” in IEEE Int. Symp. on Circuits Syst. (ISCAS), 2010, pp. 2167–2170
  P. Witte, C. Noeske, and M. Ortmanns
  
• “Background DAC error estimation using a pseudo random noise based correlation technique for Sigma-Delta Analog-to-Digital,” IEEEE Trans. Circuits Syst. I, Reg. Papers, vol. 57 no. 7, pp. 1500–1512, 2010
  P. Witte and M. Ortmanns
  
• “Practical considerations and hardware complexity of a background DAC error estimation for Sigma-Delta ADCs,” in 11. ITG/GMM-Fachtagung Analog, Erfurt, Deutschland, 2010
  P. Witte, C. Noeske, and M. Ortmanns
  
• “A 8mW, 50MS/s CT ∆Σ modulator with w 81dB SFDR and digital background DAC linearization,” in IEEE International Solid-State Circuits Conference (ISSCC), 2011
  J. Kauffman, P. Witte, J. Becker, and M. Ortmanns
  
• “A digital background correction for DAC nonlinearities in lowpass and bandpass Delta-Sigma modulators - Theory and Implementation,” in The 9th International Conference on Sampling Theory and Applications (SAMPTA), 2011
  P. Witte, J. Kauffman, J. Becker, and M. Ortmanns