Design and Integration of Test Module for Microfluidic Large-Scale Integration (mLSI)

• Applicant: Dr.-Ing. Tsun-Ming Tseng
• Subject Area: Computer Architecture, Embedded and Massively Parallel Systems
• Term: since 2021
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 456006534

Microfluidic large-scale integration (mLSI) is a promising lab-on-a-chip platform for high throughout bio-applications. Due to the high integration scale and the small feature size, control channels on mLSI chips are prone to defects. Current methods for testing control channel defects are limited by the flow-layer structure of mLSI chips and thus cannot guarantee their fault coverage. In this project, we propose to develop a completely new methodology for mLSI testing. By designing and integrating a new mLSI component named test module, tests can be performed on this additional component and the test results can be collected on site. Neither specialized software nor external pressure sensors are required for carrying out the tests. We will develop efficient algorithms for test pattern generation to test different types of channel defects. For physical design, i.e., placement and routing, we will consider the test module together with the to-be-tested design as a whole to achieve the best synchronization. With this new methodology, we ensure full fault coverage with moderate area overhead.

• DFG Programme: Research Grants