Project Details
Laterales Wachstum von Si- und SiGe-LPE Schichten auf strukturierten Substraten
Applicant
Privatdozent Dr. Michael Hanke
Subject Area
Mineralogy, Petrology and Geochemistry
Term
from 2005 to 2009
Project identifier
Deutsche Forschungsgemeinschaft (DFG) - Project number 5446216
Final Report Year
2009
Final Report Abstract
No abstract available
Publications
-
Analysis of epitaxial laterally overgrown silicon structures by high resolution xray rocking curve imaging. Cryst. Res. Technol. 44 (2009) 534
B. Heimbrodt, D. Lübbert, R. Köhler, T. Boeck, A.-K. Gerlitzke, and M. Hanke