Reliability Assessment (B03)

• Subject Area: Electronic Semiconductors, Components and Circuits, Integrated Systems, Sensor Technology, Theoretical Electrical Engineering
• Term: since 2025
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 528378584

When bringing new electronic devices – both logic and memory – into practical systems, reliability is often the limiting factor. In this TRR we expect new reliability effects to show up since we use BEOL compatible materials and processes that have inherent higher defect density as well as novel device architectures. The role of this project is to assess the reliability on the device level already in an early phase, give feedback to the projects of Research Area A for required improvements on the device level and build a database that can be used in phase two and three to establish tailored fault and degradation models and tolerance strategies to overcome the identified reliability issues.

• DFG Programme: CRC/Transregios
• Subproject of: TRR 404: Next Generation Electronics with Active Devices in Three Dimensions (Active-3D)
• Applicant Institution: Technische Universität Dresden
• Co-Applicant Institution: Rheinisch-Westfälische Technische Hochschule Aachen
• Project Head: Dr.-Ing. Benjamin Max