High-resolution, analytical & in situ electron microscopy of atomic struc¬ture, local chemistry and structural evolution of solution-processed thin films (S02)

• Subject Area: Physical Chemistry of Solids and Surfaces, Material Characterisation ; Thermodynamics and Kinetics as well as Properties of Phases and Microstructure of Materials
• Term: since 2025
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 538767711

Project S2 provides top-view and cross-section microscopic characterization using electron microscopy of solution-grown solids (with C3, C4, F3, F5, F6). The project will provide insight into epitaxial relationships, bonding characteristics, composition gradients, coherency strain, and the formation of defects, complemented by spectroscopic and X-ray scattering information from C5, S3, S4, S5, F1, and with interpretation enabled by M1, M2, M3 and M5. Methodical developments will be related to the beam-sensitive nature of some solids investigated, the drive for high-throughput microscopic analysis, in situ studies of film stability and the need to investigate samples unmodified by aerobic exposure.

• DFG Programme: Collaborative Research Centres
• Subproject of: SFB 1719: Next-generation printed semiconductors: Atomic-level engineering via molecular surface chemistry
• Applicant Institution: Friedrich-Alexander-Universität Erlangen-Nürnberg
• Project Head: Professor Dr. Erdmann Spiecker, since 7/2025