atomic force microscope-scanning electrochemical microscope

• Subject Area: Chemical Solid State and Surface Research
• Term: Funded in 2025
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 570236905

In this project, we propose the procurement of an integrated, high-resolution atomic force microscope-scanning electrochemical microscope (AFM-SECM) for the investigation of photo- and electrochemical reactions and electrochemically controlled nanofabrication of thin films and structures. The on-going and planned research work using the proposed instrument can be categorized into three research areas. Research area 1 carries out the fundamental studies of materials in the form of films, layers, and structures. The investigation includes their nucleation, surface coverage, homogeneity, presence of defects, and charge transfer properties. Research area 2 performs nanoscale investigation of photo-, thermo-, and flow electrochemical reactions of various materials, including semiconductor thin films, exfoliated 2D layered materials, photoactive molecules, perovskite layers, 1D nanostructures, and polymer-carbon composites, in close collaboration with other working groups in FAU. For this purpose, the requested instrument and its electrochemical cell will be customized, modified and integrated with various accessories to allow for the study of electrochemical reactions in diverse environments. Research area 3 employs the scanning probe to perform electrochemical nanofabrication, including surface structuring, patterning, deposition, and modification. The requested instrument combines the advantages of comprehensive electrochemical analysis of SECM and the nanoscale probe of AFM for high-resolution tip-substrate interactions. AFM-SECM improves the resolution of electrochemical investigations, precisely pointing at the targeted structure for simultaneous recording of multidimensional information. The information collected can be compared to other nanocharacterization techniques and can be correlated with other structural, morphological, electrical and electrochemical activities at high spatial resolution. The correlation is essential for gaining an in-depth understanding of the relationship between material properties and their electrochemical behavior. Such insights are particularly critical for developing new materials and processes for enhanced photo- and electrocatalysis reactions, ultimately achieving efficient, long-term, and stable sustainable energy production.

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: Rasterkraftmikroskop - Elektrochemisches Rastermikroskop
• Instrumentation Group: 5091 Rasterkraft-Mikroskope
• Applicant Institution: Friedrich-Alexander-Universität Erlangen-Nürnberg
• Leader: Professorin Dr. Siow Woon Ng, Ph.D.