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Environmental Scanning Electron Microscopy (E-SEM)

Subject Area Chemical Solid State and Surface Research
Term since 2026
Project identifier Deutsche Forschungsgemeinschaft (DFG) - Project number 572508722
 
With this application we apply for a scanning electron microscope for operation under specific environmental conditions (environmental scanning electron microscope, E-SEM). The instrument shall allow the examination of samples at ambient pressures of up to 4000 Pa and variable sample temperatures (approximately -70 to +100 °C). In addition to detectors for backscattered and secondary electrons, the instrument shall also be equipped with a detector for energy-dispersive X-ray spectroscopy (EDX). The instrument will be used to study minerals that play a central role in geochemistry and atmospheric research. To investigate fundamental geochemical processes, imaging natural cleavage planes of minerals, especially under special environmental conditions, is essential. Among other applications, the instrument will be used to investigate weathering processes of minerals that are responsible for the storage of (anthropogenic) carbon within carbonates. In clouds, mineral particles act as ice nucleating particles, enabling the heterogeneous nucleation of ice at higher temperatures and thereby influencing the physical properties (e.g., albedo) of the clouds. Imaging cleavage planes under water vapor and at variable temperatures provides an ideal opportunity to directly observe these fundamental geochemical processes. To study ice formation, a water vapor partial pressure of at least 1300 Pa (corresponding to the vapor pressure of liquid water at +10 °C) and the ability to variably adjust the temperature of the sample stage in the range of -70 to +10 °C must be possible. For many geochemical processes, it is also important to determine the precise elemental composition of the involved minerals, which is why EDX will be utilized here as well. Furthermore, the device will be used to investigate perovskites. Currently, research is being conducted on long-term stable, lead-free alternatives for the use of perovskites in solar cells. The requested instrument will be used to examine functional coatings, with a particular focus on element-specific analysis via EDX. Additionally, the device will also be used for comparative studies to extend the development of high-resolution optical microscopy (super-resolution microscopy) for the examination of tissue samples and live specimens. For this purpose, comparative measurements with an E-SEM as a benchmark will be of utmost value. Moreover, the device will also be available for further measurements within the framework of the Analytical Center Ostwestfalen-Lippe and for service measurements.
DFG Programme Major Research Instrumentation
Major Instrumentation Rasterelektronenmikroskop für Messungen unter besonderen Umgebungsbedingungen
Instrumentation Group 5120 Rasterelektronenmikroskope (REM)
Applicant Institution Universität Bielefeld
 
 

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