Five-circle X-Ray diffractometer (Renewal)

• Subject Area: Production Technology
• Term: since 2026
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 579016815

The unique design of the five-circle diffractometer Seifert XRD 3003 ETA enables not only the analysis of qualitative and quantitative phase fractions, texture, and microstructures, but also the non-destructive determination of depth-resolved residual stress states in the near-surface region. Thanks to its individually movable eight axes (three on the sample stage, five on the goniometer), the penetration depth of the X-rays can be geometrically reduced continuously and precisely from the maximum penetration depth of the radiation used. This allows for precise analysis of residual stress states down to a material-specific depth (maximum penetration depth). In this way, real samples with varying characteristics, such as chemical or residual stress gradients can be optimally analyzed. Current applications include the analysis of complex multilayer coating systems with a chemical or residual stress gradient, the analysis of additively manufactured porous samples with a chemical gradient, or the formation and influence of oxide passivation layers on residual stress states. The Seifert XRD 3003 ETA at the Institute of Production Engineering and Machine Tools of Leibniz University Hannover is one of only three diffractometers of this special type worldwide. The electronic control system for the various axes, built in 2003, is outdated and prone to failure after more than twenty years of operation. The required electronic circuit diagrams for repair are no longer available, and the necessary spare parts can only be obtained second-hand, in limited quantities, and without warranty. To preserve this unique measuring instrument and to ensure its long-term usability for years to come, a complete refurbishment of the electronic control system is crucial.

• DFG Programme: Major Research Instrumentation
• Major Instrumentation: Fünfkreis-Röntgendiffraktometer
• Instrumentation Group: 4010 Einkristall-Diffraktometer
• Applicant Institution: Gottfried Wilhelm Leibniz Universität Hannover
• Leader: Dr. Hilke Petersen