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Methoden der Selbstreparatur für Logik-Baugruppen und Verbindungsstrukturen in Nano-Technologien (SELNA)

Subject Area Computer Architecture, Embedded and Massively Parallel Systems
Term from 2007 to 2011
Project identifier Deutsche Forschungsgemeinschaft (DFG) - Project number 63403581
 
Final Report Year 2011

Final Report Abstract

No abstract available

Publications

  • "Basic Architecture for Logic Self Repair," IOLTS, pp.177-178, 2008 14th IEEE International On-Line Testing Symposium, 2008, ISBN: 978-0- 7695-3264-6
    Tobias Koal, Heinrich T. Vierhaus
  • „Möglichkeiten und Grenzen der Selbstreparatur für Logik“, Proc. 2. GMM/GI/ITG- Arbeitstagung „Zuverlässigkeit und Entwurf“, Ingolstadt, September /Oktober 2008, Reihe GMM-Fachberichte No. 57, ISBN 978-3-8007-3119-pp. 57- 64
    T. Koal, D. Scheit, H. T. Vierhaus
  • „A Concept for Logic Self Repair“, Proc. 12th Euromicro Conference on Digital System Design (DSD), Patras, August 2009, pp. 221-224, IEEE CS Press, 2009, ISBN 978-0-7695-3782-5, pp. 621-624
    T. Koal, D. Scheit, H. T. Vierhaus
  • „Reliability Estimation Process“, Proc. 12th Euromicro Conference on Digital System Design (DSD), Patras, August 2009, pp. 221-224, IEEE CS Press, 2009, ISBN 978-0-7695-3782-5, pp. 221-224
    T. Koal, D. Scheit, H. T. Vierhaus
  • “HW / SW Co-Detection of Transient and Permanent Faults with Fast Recovery in Statically Scheduled Data Paths”, Proc. IEEE Design and Test in Europe (DATE) 2010, Dresden, March 2010
    Mario Schölzel
  • „Combining De-Stressing and Self Repair for Long-Term Dependable Systems”, Proc. IEEE DDECS 2010, Vienna, April 2010
    Tobias Koal, Heinrich T. Vierhaus
  • “Optimal Spare Utilization for Reliability and Mean Lifetime Improvement for Logic Built-in Self Repair“, Proc. 14th IEEE Int. Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2011), Cottbus, April 2011, pp. 219- 224
    T. Koal, H. T. Vierhaus
  • „Design and Test Technology for Dependable Systems on Chip”, IGI Global Book Company, Hershey, PA, 2011, ISBN 978-1-60960-212-3
    Raimund Ubar, Jaan Raik, Heinrich T. Vierhaus
 
 

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