Atomic-scale insight into the morphology and electronic structure of 2D semiconductors using scanning probe microscopy (S01)

• Subject Area: Physical Chemistry of Solids and Surfaces, Material Characterisation
• Term: since 2025
• Project identifier: Deutsche Forschungsgemeinschaft (DFG) - Project number 538767711

Project S1 (Maier) exploits scanning probe microscopy and spectroscopy to investigate the structure and electronic structure of ultrathin semiconductor crystals with atomic resolution. STM and AFM will provide insight into the nature and structure of nucleation sites on the substrates, detail the solid’s organization around nucleation points, and further growth (with C1, C2). STS will investigate bandgaps and point defects. With complementary methods (C4, C5, S4, S5), S1 will provide a full picture, in ultimate resolution, of the nucleus’ influence on properties (with M1, M2, M4) and suggest avenues for the chemistry of attachments (C2, C3).

• DFG Programme: Collaborative Research Centres
• Subproject of: SFB 1719: Next-generation printed semiconductors: Atomic-level engineering via molecular surface chemistry
• Applicant Institution: Friedrich-Alexander-Universität Erlangen-Nürnberg
• Project Head: Professorin Dr. Sabine Maier, since 7/2025